Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

The system uses a remote liquefaction scheme to deliver continuous cooling without mechanical vibrations, enabling ångström-resolution imaging without the need of liquid helium. Optical-coupled ...

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NC-AFM 2026 – Scientific and Social Program . On Monday morning, a Zurich Instruments and Scienta Omicron Technical Symposium ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

What is Magnetic Force Microscopy (MFM)? Magnetic Force Microscopy (MFM) is a scanning probe microscopy technique that allows the imaging and characterization of magnetic properties of materials at ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...