This article describes a six-inch wafer inspection microscope that provides automated, reproducible differential interference contrast (DIC) imaging, regardless of the user’s skill level. Wafer ...
Recent breakthroughs in microscopy are enabling scientists to capture sharper, faster, and more reliable images of live cells and complex 3D samples. Caltech's Digital Defocus Aberration Interference ...
A physics-based autofocus method uses dual LED lighting to detect and correct defocus in microscopes. It enhances imaging ...
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