Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.

Creating a system to localize failure mechanisms causing abnormal electrical behavior, including those linked to complex parameters (such as frequencies, amplitudes, and digital values contained in ...

October 26, 2012. Aegis Software announced that Sechan Electronics Inc., a contract manufacturing services company, chose Aegis’ Quality System as a replacement for Sechan's paper-based defect mapping ...